High Recognition Ratio Image Processing Algorithm of Micro Electrical Components in Optical Microscope
| Main Authors: | Jie, Wu; Xi'an Jiaotong University, Feng, Zuren; Xi'an Jiaotong University, Wang, Lei; Xi'an Railway Vocational & Technical Institute |
|---|---|
| Other Authors: | This work was partially supported by Ph. D. Programs Foundation of Ministry of Education of China (20100201110031), National Natural Science Foundation of China (61105126 & 60875043), and Special Foundation of President of Xi’an Technological University ( |
| Format: | Article info application/pdf eJournal |
| Bahasa: | eng |
| Terbitan: |
Universitas Ahmad Dahlan
, 2014
|
| Online Access: |
http://journal.uad.ac.id/index.php/TELKOMNIKA/article/view/304 http://journal.uad.ac.id/index.php/TELKOMNIKA/article/view/304/pdf_46 |
| ctrlnum |
article-304 |
|---|---|
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<dc schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><title lang="en-US">High Recognition Ratio Image Processing Algorithm of Micro Electrical Components in Optical Microscope</title><creator>Jie, Wu; Xi'an Jiaotong University</creator><creator>Feng, Zuren; Xi'an Jiaotong University</creator><creator>Wang, Lei; Xi'an Railway Vocational & Technical Institute</creator><description lang="en-US">In order to process small components of original image under the microscope, firstly, this paper adopts median filtering algorithm to enhance targets; and the targets are sharpened by using lateral inhibition algorithm, the edge of targets is outlined. In order to get reliable target region, adaptive threshold segmentation algorithm is used to extract need target region, and characteristics of target is used to distinguish multiple targets. Based on the chip resistor, one tiny component, in the captured image, we judge if the chip resistor is qualified by calculating the pixels area values. The experimental results show that, the image processing algorithm and qualified detection algorithm is reasonable, which provides the theoretical basis and implementation method of effective target extraction and further qualified test.</description><publisher lang="en-US">Universitas Ahmad Dahlan</publisher><contributor lang="en-US">This work was partially supported by Ph. D. Programs Foundation of Ministry of Education of China (20100201110031), National Natural Science Foundation of China (61105126 & 60875043), and Special Foundation of President of Xi’an Technological University (</contributor><date>2014-12-01</date><type>Journal:Article</type><type>Other:info:eu-repo/semantics/publishedVersion</type><type>Other:</type><type>File:application/pdf</type><identifier>http://journal.uad.ac.id/index.php/TELKOMNIKA/article/view/304</identifier><identifier>10.12928/telkomnika.v12i4.304</identifier><source lang="en-US">TELKOMNIKA (Telecommunication Computing Electronics and Control); Vol 12, No 4: December 2014; 911-920</source><source>2302-9293</source><source>1693-6930</source><source>10.12928/telkomnika.v12i4</source><language>eng</language><relation>http://journal.uad.ac.id/index.php/TELKOMNIKA/article/view/304/pdf_46</relation><rights lang="0">Copyright (c) 2014 Universitas Ahmad Dahlan</rights><rights lang="0">http://uad.ac.id</rights><recordID>article-304</recordID></dc>
|
| language |
eng |
| format |
Journal:Article Journal Other:info:eu-repo/semantics/publishedVersion Other Other: File:application/pdf File Journal:eJournal |
| author |
Jie, Wu; Xi'an Jiaotong University Feng, Zuren; Xi'an Jiaotong University Wang, Lei; Xi'an Railway Vocational & Technical Institute |
| author2 |
This work was partially supported by Ph. D. Programs Foundation of Ministry of Education of China (20100201110031), National Natural Science Foundation of China (61105126 & 60875043), and Special Foundation of President of Xi’an Technological University ( |
| title |
High Recognition Ratio Image Processing Algorithm of Micro Electrical Components in Optical Microscope |
| publisher |
Universitas Ahmad Dahlan |
| publishDate |
2014 |
| url |
http://journal.uad.ac.id/index.php/TELKOMNIKA/article/view/304 http://journal.uad.ac.id/index.php/TELKOMNIKA/article/view/304/pdf_46 |
| contents |
In order to process small components of original image under the microscope, firstly, this paper adopts median filtering algorithm to enhance targets; and the targets are sharpened by using lateral inhibition algorithm, the edge of targets is outlined. In order to get reliable target region, adaptive threshold segmentation algorithm is used to extract need target region, and characteristics of target is used to distinguish multiple targets. Based on the chip resistor, one tiny component, in the captured image, we judge if the chip resistor is qualified by calculating the pixels area values. The experimental results show that, the image processing algorithm and qualified detection algorithm is reasonable, which provides the theoretical basis and implementation method of effective target extraction and further qualified test. |
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