Nanoscale Residual Stress Depth Profiling by Focused Ion Beam Milling and Eigenstrain Analysis
Main Author: | Korsunsky, Alexander |
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Other Authors: | Salvati, Enrico, Sebastiani, Marco, Mughal, Zeeshan |
Format: | Dataset |
Terbitan: |
Mendeley
, 2018
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Subjects: | |
Online Access: |
https:/data.mendeley.com/datasets/vb78jgkw4z |
Internet
https:/data.mendeley.com/datasets/vb78jgkw4zLokasi
Koleksi | Artikel mulono |
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Gedung | Teknologi Pangan UNISI |
Institusi | Universitas Islam Indragiri |
Kota | INDRAGIRI HILIR |
Provinsi | RIAU |
Kontak | Butuh informasi lebih lanjut? Hubungi pustakawan institusi ini. |