Nanoscale Residual Stress Depth Profiling by Focused Ion Beam Milling and Eigenstrain Analysis
| Main Author: | Korsunsky, Alexander |
|---|---|
| Other Authors: | Salvati, Enrico, Sebastiani, Marco, Mughal, Zeeshan |
| Format: | Dataset |
| Terbitan: |
Mendeley
, 2018
|
| Subjects: | |
| Online Access: |
https:/data.mendeley.com/datasets/vb78jgkw4z |
Internet
https:/data.mendeley.com/datasets/vb78jgkw4zLokasi
| Koleksi | Artikel mulono |
|---|---|
| Gedung | Teknologi Pangan UNISI |
| Institusi | Universitas Islam Indragiri |
| Kota | INDRAGIRI HILIR |
| Provinsi | RIAU |
| Kontak | Butuh informasi lebih lanjut? Hubungi pustakawan institusi ini. |