Dynamic Variation in Nano-Scale CMOS SRAM Cells Due to LF/RTS Noise and Threshold Voltage
Main Authors: | M. Fadlallah, G. Ghibaudo, C. G. Theodorou |
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Format: | Article |
Bahasa: | eng |
Terbitan: |
, 2018
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Subjects: | |
Online Access: |
https://zenodo.org/record/1317382 |