Dynamic Variation in Nano-Scale CMOS SRAM Cells Due to LF/RTS Noise and Threshold Voltage
| Main Authors: | M. Fadlallah, G. Ghibaudo, C. G. Theodorou |
|---|---|
| Format: | Article |
| Bahasa: | eng |
| Terbitan: |
, 2018
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| Subjects: | |
| Online Access: |
https://zenodo.org/record/1317382 |