MOdelling DAta providing a description for Near-field Excited Semiconductor Structure simulated in project MMAMA

Main Authors: Smajic, Jasmin, Celuch, Malgorzata, Kienberger, Ferry
Format: Report eJournal
Terbitan: , 2019
Online Access: https://zenodo.org/record/2577307
Daftar Isi:
  • The following document provides a modelling workflow for simulating a sharp metallic tip in contact with a semiconductor. The covered frequency range is 1-100 GHz and the covered wire-tip diameter is 5 nm - 100 nm while the other end of the wire has a diameter of 0.5 mm. The output of the simulation are the electromagnetic fields, S-parameters and charge carrier density and velocity.