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Nanoscale Residual Stress Depth Profiling by Focused Ion Beam Milling and Eigenstrain Analysis

Dataset

oleh Korsunsky, Alexander

Terbitan	: Mendeley, 2018
Institusi	: Universitas Islam Indragiri
Gedung	:

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Lokasi	Repository	IOS Number
		IOS7969.0.17632-vb78jgkw4z.1

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