Low temperature inorganic chemical vapor deposition of Ti–Si–N diffusion barrier liners for gigascale copper interconnect applications

Main Authors: Eisenbraun, Eric, Kaloyeros, Alain E, Arkles, Barry
Format: Article
Bahasa: eng
Terbitan: , 2000
Subjects:
Online Access: https://zenodo.org/record/3969062
Description not available.